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Specification
Brand : Huanyu
BulletPoint1 : Four-Point Probe Test Bracket with Probe only! The probe needs to be used in conjunction with the Resistance Tester. (Resistance Tester is not included.)Four-Point Probe Test Bracket with Probe only! The probe needs to be used in conjunction with the Resistance Tester. (Resistance Tester is not included.)
BulletPoint2 : Parameters: (About Straight Line Four-Point Probe) Type: Linear; Material: Nickel Plated Phosphor Copper; Distance Between 2 Neighbouring Probes :2mm; Resultant Force: 4±1N; The Probes Distance Correction Factor Fsp: Refer to Manual
BulletPoint3 : Replaceable Probe: 6 types of probes are available for selection to meet the application requirements of different testing scenarios. This link is for Model J1 probe
BulletPoint4 : Application: Suitable for testing the sheet resistance and resistivity of uniform rigid conductive and semiconductor films, such as ITO conductive glass, FTO conductive glass, AZO conductive glass, flexible ITO conductive films, sheet metal layers
BulletPoint5 : Note: NOT suitable for testing conductive polymer films or silicon wafers with rough surfaces. If you need to test the resistance of materials such as silicon wafers, nano-silver films, graphene films, carbon paste films, confirm with us in advance
IncludedComponents : Four-Point Probe Test Bracket with Probe*1
ItemName : Hunayu Four-Point Probe Test Bracket with Probe*1 Suitable for Huanyu Four Point Probe Resistance Tester Sheet Resistance of Uniform Rigid Conductive Semiconductor Film (Bracket B + Probe, J1)
ItemTypeKeyword : test-probes
Manufacturer : Huanyu
MeasurementAccuracy : ±0.1%
NumberOfItems : 1
PartNumber : LXR-94
ProductDescription : Hunayu Four-Point Probe Test Bracket with Probe

Parameters
Model: J1 Type: Linear;
Material: Nickel Plated Phosphor Copper;
Distance Between 2 Neighbouring Probes :2mm;
Resultant Force: 4±1N;
The Probes Distance Correction Factor Fsp: Refer to Manual

Note
Four-Point Probe Test Bracket with Probe only! The probe needs to be used in conjunction with the Resistance Tester. (Resistance Tester is not included.)
Replaceable Probe 6 types of probes are available for selection to meet the application requirements of different testing scenarios. This link is for Model J1 probe
Application Suitable for testing the sheet resistance and resistivity of uniform rigid conductive and semiconductor films, such as ITO conductive glass, FTO conductive glass, AZO conductive glass, flexible ITO conductive films, sheet metal layers
NOT Suitable for testing conductive polymer films or silicon wafers with rough surfaces. If you need to test the resistance of materials such as silicon wafers, nano-silver films, graphene films, carbon paste films, confirm with us in advance

ProductSiteLaunchDate : 2024-11-02T08:12:17.852Z
SupplierDeclaredDgHzRegulation : not_applicable
SupplierDeclaredHasProductIdentifierExemption : 1
UnspscCode : 41113600