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VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter

VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter

Customer rating ★★★★★☆ 4.6 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

1

₹68000 -30% ₹47600/-

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Product Information


Specification
Brand : VTSYIQI
Label : VTSYIQI202310111408
Manufacturer : VTSYIQI202310111408
MaterialType : Plastic
NumberOfItems : 1
PackageDimensions_Weight : 4.4092452400
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : VTSYIQI202310111408
ProductGroup : BISS Basic
ProductTypeName : PRECISION_MEASURING
Publisher : VTSYIQI202310111408
SmallImage_Height : 75
SmallImage_URL : https://m.media-amazon.com/images/I/21IabrssXGL._SL75_.jpg
SmallImage_Width : 48
Studio : VTSYIQI202310111408
Title : VTSYIQI Leeb Hardness Tester Impact Device Small Aperture DC Impact Device Probe for Leeb Hardness Tester Meter
Weight : 4.4
WeightUnit : pounds

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Ratings & Review

Rating Breakdown (average)

5*
6
4*
2
3*
1
2*
0
1*
0

Read all 9 customer reviews

Everything about this is perfect.

★★★★★

Meets basic needs, not exceptional.

★★★★★

Five stars all the way.

★★★★★

Five stars all the way.

★★★★★

Best product IÕve bought recently.

★★★★★

This deserves more than 5 stars.

★★★★★

Totally worth every penny.

★★★★★

Well-made and looks great.

★★★★★

Will definitely recommend to others.

★★★★★

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