VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test

Customer rating 4.6 stars

Imported from USA | Ships in 10 working days

5% additional discount on UPI | Cash On Delivery available

1

₹91640 -39% ₹55900/-

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Product Information


Specification
Amount : 600.00
Brand : VTSYIQI
Color : Yellow
CurrencyCode : USD
Label : VTSYIQI202310111444
Manufacturer : VTSYIQI202310111444
MaterialType : plastic
Model : C type impact device
NumberOfItems : 1
PackageDimensions_Weight : 0.8818490480
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : C type impact device probe
ProductGroup : BISS Basic
ProductTypeName : ELECTRIC_CIRCUIT_TESTING_DEVICE
Publisher : VTSYIQI202310111444
Size : Large
SmallImage_Height : 75
SmallImage_URL : https://m.media-amazon.com/images/I/41NXoA6tsoL._SL75_.jpg
SmallImage_Width : 56
Studio : VTSYIQI202310111444
Title : VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test
Weight : 0.9
WeightUnit : pounds

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A smart purchase for the price.

Practical and effective.

Satisfactory but not impressive.

An average experience overall.

Extremely satisfied with the product.

This works like a charm.

Lives up to the hype.

Totally worth every penny.

Remarkably good and exceeded all expectations.

Extremely satisfied with the product.

High quality and great value.

Everything about this is perfect.

High quality and great value.

Remarkably good and exceeded all expectations.

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