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VTSYIQI Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test

VTSYIQI Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test

Customer rating ★★★★★☆ 4.8 stars

Imported from USA | Ships in 10 working days

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₹82430 -34% ₹54400/-

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Product Information


Specification
Amount : 600.00
Brand : VTSYIQI
CurrencyCode : USD
Label : VTSYIQI
Manufacturer : VTSYIQI
MaterialType : plastic
Model : C type impact device
NumberOfItems : 1
PackageDimensions_Weight : 5.0706320260
PackageDimensions : L:11.81102361000 X W:7.87401574000 X H:3.93700787000
PartNumber : C type impact device probe
ProductGroup : BISS Basic
ProductTypeName : ELECTRIC_CIRCUIT_TESTING_DEVICE
Publisher : VTSYIQI
SmallImage_Height : 66
SmallImage_URL : https://m.media-amazon.com/images/I/41cpOaLTOfL._SL75_.jpg
SmallImage_Width : 75
Studio : VTSYIQI
Title : VTSYIQI Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test
Weight : 5.1
WeightUnit : pounds

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Ratings & Review

Rating Breakdown (average)

5*
9
4*
2
3*
0
2*
0
1*
0

Read all 11 customer reviews

Top-notch quality, canÕt complain.

★★★★★

Best in its category!

★★★★★

Worth the price, satisfied.

★★★★★

Truly exceeded my expectations.

★★★★★

Nice features and easy to handle.

★★★★★

One of the best things IÕve ever bought.

★★★★★

Extremely satisfied with the product.

★★★★★

Performs perfectly and looks amazing.

★★★★★

Stunning design and excellent performance.

★★★★★

Impressive quality and durability.

★★★★★

Five stars all the way.

★★★★★

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